TY  - GEN
AU  - Krause-Rehberg,R.
AU  - Leipner,H.S.
AU  - Cardona,M
AU  - Fulde,P
AU  - Klizing,Von K.
AU  - Merlin,R.
TI  - Positron annihilation in semiconductors: defect studies
SN  - 0003540643710
U1  - 621.38152 KRA L 127 
PY  - 1999///
CY  - New York : 
PB  - Springer, 
N1  - Includes reference & index
ER  -