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Microelectronics an intergrated approach

Howe, Roger T.

Microelectronics an intergrated approach Roger T. Howe - New Delhi : Pearson Education Pte Ltd, 1997. - xx, 908p. ; 24 cm.

ISBN: 8129706709

Subjects--Topical Terms:
Microelectronics--Materials--Defects

Subjects--Index Terms: Microelectronics--Materials--Testing Electronics--Materials--Defects Semiconductors--Defects Electronic apparatus and appliances--Testing

Dewey Class. No.: 621.381 HOW

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