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Ferroelectric-Gate Field Effect Transistor Memories [electronic resource] : Device Physics and Applications / edited by Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon.

by Park, Byung-Eun [editor.] | Ishiwara, Hiroshi [editor.] | Okuyama, Masanori [editor.] | Sakai, Shigeki [editor.] | Yoon, Sung-Min [editor.] | SpringerLink (Online service).

Series: Topics in Applied Physics ; 131Edition: 2nd ed. 2020.Source: Springer Nature eBookMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publisher: Singapore : Springer Singapore : Imprint: Springer, 2020Online access: Click here to access online Availability: No items available.
Ferroelectric-Gate Field Effect Transistor Memories [electronic resource] : Device Physics and Applications / edited by Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon.

by Park, Byung-Eun [editor.] | Ishiwara, Hiroshi [editor.] | Okuyama, Masanori [editor.] | Sakai, Shigeki [editor.] | Yoon, Sung-Min [editor.] | SpringerLink (Online service).

Series: Topics in Applied Physics ; 131Edition: 2nd ed. 2020.Source: Springer Nature eBookMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publisher: Singapore : Springer Singapore : Imprint: Springer, 2020Online access: Click here to access online Availability: Items available for reference: Mysore University Main Library Not for loan (1) .
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